An Intelligent Cloth Quality Analysis and Reduction of Man Power in Image Processing


Authors : Kaushalya.J, Nithya.S, Padmapriya.M, Poorvisha.R, S.L. BHARATHI.

Volume/Issue : Volume 3 - 2018, Issue 3 - March

Google Scholar : https://goo.gl/DF9R4u

Scribd : https://goo.gl/WikVVK

Thomson Reuters ResearcherID : https://goo.gl/3bkzwv

Abstract : Textile industries are one of the major revenue generating industry. So greater efforts are taken in manufacturing good quality of fabrics. Defects in fabric are the major threat to textile industry. Textile industries mostly prefer manual inspection strategy for detection of faults. Later automation is made through image processing technique. Traditional inspection process for fabric defects is by human visual inspection which is inefficient, costly and time consuming. To enhance the accuracy of fabric defects detection, and save human from this tedious and stressful work, so in this paper automated fabric inspection system has been proposed. To automate this process, the fault present on the fabrics can be identified using MATLAB with Image processing techniques.

Keywords : median filter; Histogram equalization; Discrete wavelet transform; Fuzzy-C Means (FCM); Support Vector Machine (SVM).

Textile industries are one of the major revenue generating industry. So greater efforts are taken in manufacturing good quality of fabrics. Defects in fabric are the major threat to textile industry. Textile industries mostly prefer manual inspection strategy for detection of faults. Later automation is made through image processing technique. Traditional inspection process for fabric defects is by human visual inspection which is inefficient, costly and time consuming. To enhance the accuracy of fabric defects detection, and save human from this tedious and stressful work, so in this paper automated fabric inspection system has been proposed. To automate this process, the fault present on the fabrics can be identified using MATLAB with Image processing techniques.

Keywords : median filter; Histogram equalization; Discrete wavelet transform; Fuzzy-C Means (FCM); Support Vector Machine (SVM).

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