Structural and Morphological properties are
the two fundamental tasks involved in the physical
characterization newly synthesized nanostructured
material. In this paper, Statistical image analysis of
SEM images is employed for the characterization of Mg,
Ce co-doped CdO nanosystems. Statistical parameters:
Mean, Energy, Homogeneity and Edge density of the
SEM images are computed using MATLAB software.
The formation of crystalline grains and grain
boundaries of SEM images are used as key features for
the characterization of CdOnanosystems with
increasing concentration of dopants Mg and Ce.
Molecular structure of the material was elucidated
using X- ray diffraction studies.Results obtained from
this methodology are compared with the X-rd studies
and are in good agreement with each other.
Keywords : Nano Materials, Scanning Electron Microscopy, X-Ray Diffraction, Statistical Image Analysis, Morphological Properties, MATLAB.