Authors : Mohammed Alashur

Volume/Issue : Volume 10 - 2025, Issue 8 - August

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DOI : https://doi.org/10.38124/ijisrt/25aug492

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Abstract : Static electricity, or electrostatic discharge (ESD), presents a significant threat to the performance and reliability of digital electronic circuits. As digital devices become increasingly miniaturized and densely packed, they become more vulnerable to ESD-related failures. This paper examines the origin, mechanisms, and impacts of static electricity on digital circuits, as well as the methods of protection and mitigation currently in practice. It also discusses advancements in ESD protection components and materials, and explores future directions for robust digital circuit design.

References :

1. Johnson, M. (2022). “ESD Protection Techniques for CMOS Circuits.” IEEE Transactions on Device and Materials Reliability, 22(1), 100-110.
2. Zhang, L. & Singh, P. (2023). “PCB Design Strategies for Enhanced ESD Immunity.” Journal of Electronics and Systems, 45(3), 210-223.
3. Tanaka, K. (2024). “Electrostatic Discharge in Nano-Scale Digital Devices.” Microelectronics Reliability, 134, 110739.
4. IEC 61000-4-2 (2020). “Electromagnetic Compatibility – Testing and Measurement Techniques – ESD Immunity Test.”
5. ESDA S20.20 (2021). “Standard for Development of an ESD Control Program.”