Authors :
Vempuluru Kusuma; Ch. Pallavi
Volume/Issue :
Volume 10 - 2025, Issue 10 - October
Google Scholar :
https://tinyurl.com/z729k2bx
Scribd :
https://tinyurl.com/45vack53
DOI :
https://doi.org/10.38124/ijisrt/25oct315
Note : A published paper may take 4-5 working days from the publication date to appear in PlumX Metrics, Semantic Scholar, and ResearchGate.
Note : Google Scholar may take 30 to 40 days to display the article.
Abstract :
Transistor size decreases with technological advances and increases speed. This reduction leads to SRAM cells
used for air and space applications. it is vulnerable to radiation. triggering multi-node agitation as well. There are energy-
efficient dual node upsets in this article. For low- performance air and space applications, recoverable 14T- SRAM cells
were used. In this extend, the modern RSP-14T- SRAM-Bitzelle (radiation remedy in speed and execution) points to make
strides speed, execution productivity and unwavering quality in radiation-prone situations. The proposed RSP-14T 8-bit
SRAM cell plan by optimizing at the format level of 65 nm-CMOS innovation. By stacking the cooperation impact into the
off-state transistor, this plan makes strides flexibility against single occasion disarray and occasions for a few grades of
disarray. In high-rating situations, overwhelming particle strikes can ionize semiconductor materials and make intemperate
loads that can be recorded at delicate circuit hubs. This makes the placement ideal for radiation curing capabilities.
Keywords :
14T SRAM, Aerospace Applications, Tanner EDA, High-Performance Memory and 65 nm CMOS.
References :
- S. Pal, G. Chowdary, W. -H. Ki and C. -Y. Tsui, "Energy- Efficient Dual-Node-Upset-Recoverable 12T SRAM for Low- Power Aerospace Applications," in IEEE Access, vol. 11, pp. 20184-20195, 2023, doi:10.1109/ACCESS.2022.3161147.
- S. Pal, D. D. Sri, W.-H. Ki, and A. Islam, highly stable low power radiation hardened memory-by-design SRAM for space applications, IEEE Trans. Circuits Syst. II, Exp. Briefs, vol. 68, no. 6, pp 2147-2151, Jun. 2021, doi: 10.1109/TCSII.2020.3042520.
- S. Pal, S. Mohapatra, W.-H. Ki, and A. Islam, Soft-error- immune read stability-improved SRAM for multi-node upset tolerance in space applications, IEEE Trans. Circuits Syst. I, Reg. Papers, vol. 68, no. 8, pp. 33173327, Aug. 2021, doi: 10.1109/TCSI.2021.3085516.
- S.Pal,W.-H. Ki, and C.-Y.Tsui, Soft-error-aware read-stability- enhanced low-power 12T SRAM with multi-node upset recoverability for aerospace applications, IEEE Trans. Circuits Syst. I, Reg. Papers, vol. 69, no. 4, pp. 15601570, Apr. 2022, doi: 10.1109/TCSI.2022.3147675..
- J. Jiang, Y. Xu, W. Zhu, J. Xiao, and S. Zou, Quadruple cross- coupled latch-based 10T and 12T SRAM bit-cell designs for highly reliable terres trial applications, IEEE Trans. Circuits Syst. I, Reg. Papers, vol. 66, no. 3, pp. 967977, Mar. 2019, doi: 10.1109/TCSI.2018.2872507.
- S. M. Jahinuzzaman, D. J. Rennie, and M. Sachdev, A soft error tolerant 10T SRAM bit-cell with differential read capability, IEEE Trans. Nucl. Sci., vol. 56, no. 6, pp. 37683773, Dec. 2009, doi: 10.1109/TNS.2009.2032090.
- S. Pal, D. Divya, W. Ki, and A. Islam, Radiation-hardened read decoupled low-power 12T SRAM for space applications, Int. J. Circuit Theory Appl., vol. 49, no. 11, pp. 35833596, Nov. 2021. [Online]. Available:https://onlinelibrary.wiley.com/doi/abs/10.1002/cta.3093
- L. D. T. Dang, J. S. Kim, and I. J. Chang, We-quatro: Radiation hardened SRAM cell with parametric process variation tolerance, IEEE Trans. Nucl. Sci., vol. 64, no. 9, pp. 24892496, Sep. 2017, doi: 10.1109/TNS.2017.2728180.
- C. Qi, L. Xiao, T. Wang, J. Li, and L. Li, A highly reliable memory cell design combined with layout-level approach to tolerant single-event upsets, IEEE Trans. Device Mater. Rel., vol. 16, no. 3, pp. 388395, Sep. 2016, doi: 10.1109/TDMR.2016.2593590.
- C. Peng, Radiation-hardened 14T SRAM bit cell with speed and power optimized for space application, IEEE Trans. Very Large Scale Integr. (VLSI) Syst., vol. 27, no. 2, pp. 407415, Nov. 2019, doi: 10.1109/TVLSI.2018.2879341.
- S. Pal, S. Sahay, W.-H. Ki, and C.-Y. Tsui, A 10T soft-error- immune SRAM with multi-node upset recovery for low-power space applications, IEEE Trans. Circuits Syst. I, Reg. Papers, vol. 68, no. 6, pp. 24702480, Jun. 2021, doi: 10.1109/TCSI.2021.3064870.
- S. Pal, S. Sahay, W. -H. Ki and C. -Y. Tsui, "A 10T Soft-Error- Immune SRAM With Multi-Node Upset Recovery for Low- Power Space Applications," in IEEE Transactions on Device and Materials Reliability, vol. 22, no. 1, pp. 85-88, March 2022, doi: 10.1109/TDMR.2022.3147864
- J. Guo, L. Xiao, and Z. Mao, Novel low-power and highly reliable radiation hardened memory cell for 65 nm CMOS technology, IEEE Trans. Circuits Syst. I, Reg. Papers, vol. 61, no. 7, pp. 19942001, Jul. 2014, doi: 10.1109/TCSI.2014.2304658.
- Q. Zhao, C. Peng, J. Chen, Z. Lin, and X. Wu, Novel write- enhanced and highly reliable RHPD-12T SRAM cells for space applications, IEEE Trans. Very Large Scale Integr. (VLSI) Syst., vol. 28, no. 3, pp. 848852, Mar. 2020, doi: 10.1109/TVLSI.2019.2955865.
- G. Prasad, B. C. Mandi, and M. Ali, Soft-error-aware SRAM for terrestrial applications, IEEE Trans. Device Mater. Rel., vol. 21, no.4, pp. 658660, Dec.2021,doi:10.1109/TDMR.2021.3118715.
- A. Yan, Y. Chen, Y. Hu, J. Zhou, T. Ni, J. Cui, P. Girard, and X. Wen, Novel speed-and-power-optimized sram cell designs with enhanced self-recoverability from single- and double-node upsets, IEEE Trans. Circuits Syst. I, Reg. Papers, vol. 67, no. 12,pp. 46844695, 2020, doi: 10.1109/TCSI.2020.3018328
- A. Yan, Z. Wu, J. Guo, J. Song, and X. Wen, Novel double- node-upset tolerant memory cell designs through radiation- hardening-by-design and layout, IEEE Trans. Rel., vol. 68, no. 1, pp. 354363, Mar. 2019, doi: 10.1109/TR.2018.2876243.
- A. Yan, Z. Xu, X. Feng, J. Cui, Z. Chen, T. Ni, Z. Huang, P. Girard, and X. Wen, Novel quadruple-node-upset-tolerant latch designs with optimized overhead for reliable computing in harsh radiation environments,IEEETrans.Emerg.TopicsComput.,vol.10,no.1,pp.404413,Jan.2022,doi:10.1109/TETC.2020.3025584.
- A. Yan, Y. Hu, J. Cui, Z. Chen, Z. Huang, T. Ni, P. Girard, and X. Wen, Information assurance through redundant design: A novel TNU error resilient latch for harsh radiation environment, IEEE Trans. Comput., vol. 69, no. 6, pp. 789799, Jun. 2020, doi: 10.1109/TC.2020.2966200.
- M. Moghaddam, M. H. Moaiyeri, and M. Eshghi, Design and evaluation of an efficient Schmitt trigger-based hardened latch in CNTFET technology, IEEE Trans. Device Mater. Rel., vol. 17, no. 1, pp 267277, Mar. 2017,doi:10.1109/TDMR.2017.2665780.
- J. Guo, L. Xiao, T. Wang, S. Liu, X. Wang, and Z. Mao, Soft error hardened memory design for nanoscale complementary metal oxide semi conductor technology, IEEE Trans. Rel., vol. 64, no. 2, pp. 596602, 2015, doi: 10.1109/TR.2015.2410275.
- J. P. Kulkarni, K. Kim, and K. Roy, A 160 mV robust Schmitt trigger based subthreshold SRAM, IEEE J. Solid-State Circuits, vol. 42, no. 10, pp. 23032313, Oct. 2007, doi: 10.1109/JSSC.2007.897148.
- E. Abbasian, M. Gholipour, Design of a highly stable and robust 10T SRAM cell for low-power portable applications, Circuits Syst. Signal Process 41 (10) (2022) 5914–5932, https://doi.org/10.1007/s00034-022-02054-y.
- M. Elangovan, D. Karthickeyan, M. Arul Kumar, R. Ranjith, Darlington based 8T CNTFET SRAM cells with low power and enhanced write stability, Trans. Electr. Electron. Mater. (2021), https://doi.org/10.1007/s42341-021-00329-w.
- R. Nematirad, A. Pahwa, B. Natarajan, H. Wu, Optimal sizing of photo voltaic battery system for peak demand reduction using statistical models, Front. Energy Res. 11 (2023) 1297356.
Transistor size decreases with technological advances and increases speed. This reduction leads to SRAM cells
used for air and space applications. it is vulnerable to radiation. triggering multi-node agitation as well. There are energy-
efficient dual node upsets in this article. For low- performance air and space applications, recoverable 14T- SRAM cells
were used. In this extend, the modern RSP-14T- SRAM-Bitzelle (radiation remedy in speed and execution) points to make
strides speed, execution productivity and unwavering quality in radiation-prone situations. The proposed RSP-14T 8-bit
SRAM cell plan by optimizing at the format level of 65 nm-CMOS innovation. By stacking the cooperation impact into the
off-state transistor, this plan makes strides flexibility against single occasion disarray and occasions for a few grades of
disarray. In high-rating situations, overwhelming particle strikes can ionize semiconductor materials and make intemperate
loads that can be recorded at delicate circuit hubs. This makes the placement ideal for radiation curing capabilities.
Keywords :
14T SRAM, Aerospace Applications, Tanner EDA, High-Performance Memory and 65 nm CMOS.