Authors :
Madhura.R, Ravi Shankar J, Dr. Shanthi Prasad .M.J.
Volume/Issue :
Volume 3 - 2018, Issue 3 - March
Google Scholar :
https://goo.gl/DF9R4u
Scribd :
https://goo.gl/Yxw6qF
Thomson Reuters ResearcherID :
https://goo.gl/3bkzwv
Abstract :
In today’s world, good testing leads to better quality products and total customer satisfaction. This technical survey paper summarizes various important research works in low power VLSI test scan architecture.
Keywords :
Low Power, VLSI Test, Scan Architecture, FPGA Test-bed.
In today’s world, good testing leads to better quality products and total customer satisfaction. This technical survey paper summarizes various important research works in low power VLSI test scan architecture.
Keywords :
Low Power, VLSI Test, Scan Architecture, FPGA Test-bed.