Popular Case Studies of Various VLSI Test Scan Architectures
Authors : Madhura.R, Ravi Shankar J, Dr. Shanthi Prasad .M.J.
Volume/Issue : Volume 3 - 2018, Issue 3 - March
Google Scholar : https://goo.gl/DF9R4u
Scribd : https://goo.gl/Yxw6qF
Thomson Reuters ResearcherID : https://goo.gl/3bkzwv
Abstract : In today’s world, good testing leads to better quality products and total customer satisfaction. This technical survey paper summarizes various important research works in low power VLSI test scan architecture.
Keywords : Low Power, VLSI Test, Scan Architecture, FPGA Test-bed.
Keywords : Low Power, VLSI Test, Scan Architecture, FPGA Test-bed.