Popular Case Studies of Various VLSI Test Scan Architectures


Authors : Madhura.R, Ravi Shankar J, Dr. Shanthi Prasad .M.J.

Volume/Issue : Volume 3 - 2018, Issue 3 - March

Scribd : https://goo.gl/Yxw6qF

Thomson Reuters ResearcherID : https://goo.gl/3bkzwv

Abstract : In today’s world, good testing leads to better quality products and total customer satisfaction. This technical survey paper summarizes various important research works in low power VLSI test scan architecture.

Keywords : Low Power, VLSI Test, Scan Architecture, FPGA Test-bed.

In today’s world, good testing leads to better quality products and total customer satisfaction. This technical survey paper summarizes various important research works in low power VLSI test scan architecture.

Keywords : Low Power, VLSI Test, Scan Architecture, FPGA Test-bed.

Video Explanation for Published paper

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