Authors : Chandrashekhar Nivrutti Wani

Volume/Issue : Volume 9 - 2024, Issue 4 - April

Google Scholar : https://tinyurl.com/mpbmhhk2

Scribd : https://tinyurl.com/2r39y8y2

DOI : https://doi.org/10.38124/ijisrt/IJISRT24APR2232

Abstract : This review paper provides a comprehensive overview of trace element analysis utilizing ion-atom interaction techniques, focusing on the principles, applications, and recent advancements in the field. Ion- atom interaction techniques, including Particle Induced X- Ray Emission (PIXE), Particle Induced Gamma–Ray Emission (PIGE), Energy Dispersive X-Ray Analysis (EDXRF), Rutherford backscattering spectroscopy (RBS), and ion beam analysis (IBA), offer unique capabilities for trace element analysis with high sensitivity and minimal sample preparation requirements. The paper begins by discussing the fundamental principles underlying ion-atom interaction techniques, such as the interaction of energetic ions with matter and the subsequent detection of emitted X-rays or backscattered particles. It explores the various analytical parameters that influence the sensitivity, resolution, and depth profiling capabilities of these techniques. Furthermore, the review highlights the diverse applications of ion-atom interaction techniques in fields such as environmental monitoring, forensic science, biomedical research, and materials science. It showcases how these techniques have been utilized to address specific analytical challenges, such as the detection of trace contaminants in environmental samples or the characterization of thin films and semiconductor materials.

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