Authors : Chandrashekhar Nivrutti Wani; Harish Kumar; Mumtaz Oswal; K.P. Singh

Volume/Issue : Volume 9 - 2024, Issue 4 - April

Google Scholar : https://tinyurl.com/mpbmhhk2

Scribd : https://tinyurl.com/2r39y8y2

DOI : https://doi.org/10.38124/ijisrt/IJISRT24APR2232

Note : A published paper may take 4-5 working days from the publication date to appear in PlumX Metrics, Semantic Scholar, and ResearchGate.

Abstract : This review paper provides a comprehensive overview of trace element analysis utilizing ion-atom interaction techniques, focusing on the principles, applications, and recent advancements in the field. Ion- atom interaction techniques, including Particle Induced X- Ray Emission (PIXE), Particle Induced Gamma–Ray Emission (PIGE), Energy Dispersive X-Ray Analysis (EDXRF), Rutherford backscattering spectroscopy (RBS), and ion beam analysis (IBA), offer unique capabilities for trace element analysis with high sensitivity and minimal sample preparation requirements. The paper begins by discussing the fundamental principles underlying ion-atom interaction techniques, such as the interaction of energetic ions with matter and the subsequent detection of emitted X-rays or backscattered particles. It explores the various analytical parameters that influence the sensitivity, resolution, and depth profiling capabilities of these techniques. Furthermore, the review highlights the diverse applications of ion-atom interaction techniques in fields such as environmental monitoring, forensic science, biomedical research, and materials science. It showcases how these techniques have been utilized to address specific analytical challenges, such as the detection of trace contaminants in environmental samples or the characterization of thin films and semiconductor materials.

References :

1. United States Environmental Protection Agency, Environmental Technology Verification Report, Field Portable X-Ray Fluorescence Analyser, HNU Systems SEFA-P, Office of Research and Development, EPA/600/R-97/144 (1998).
2. P. D. Pérez, T. P. R. Cabello], J. C. Trincavelli, and S. Suárez, “L shell X-ray production cross sections for Sr and Mo by proton impact” Radiation Physics and Chemistry, 154, 21 (2019).
3. J. Zhao, S. Bai, Z. An, J. Zhu, W. Tan, and M. Liu, “Measuring the total L-Shell X-Ray production cross sections of Te element using 6–30 keV electron impact” Radiation Physics and Chemistry, 171, 108722 (2020).
4. S. A. Johansson and J. L. Campbell, “A Novel Technique for Elemental Analysis”, Wiley, New York (1988).
5. Abdousalam, A.G., “Effect of heavy metals on soil microbial processesandpopulation”, J. Biolog. Sci. 2, 9-14 (2010).
6. Mohammad Muqtada Ali Khan, Ali Danish Khan, Rashid Umar, HabibahLateh, “Study of trace elements in groundwater of Western Uttar Pradesh, India”, Scientific Research and Essays, 520 (20), 3175-3182 (2010).
7. Johansson S.A.E. and Campbell J.L. “PIXE Data Acquisition”, Nucl. Inst. And Meth, 849, 179 (1988).
8. Mumtaz Oswal, Harneet Bedi, M Hajivaliei, Ashok Kumar, KP Singh, “Trace elements of soil samples from mining area” Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 268, 11-12, 2138-2140 (2010).
9. C. Boni, A. Caridi, E. Cereda, and G. B. Marcazzan, Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms,45,352 (1990).
10. J. L. Campbell, N. I. Boyd, N. Grassi, P. Bonnick, and J. A. Maxwell, Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 268, 3356 (2010).